Revision history of "File:Figure-9.jpg"

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  • curprev 17:35, 15 August 2014‎ Molyneux talk contribs‎ 369 bytes +369‎ At left, a schematic diagram of operation of an FIB-SEM system. The FIB sputters away a thin layer of the sample at a time, while the electron beam/detector system captures an image of each newly exposed surface. At right, a picture of a commercial FIB...
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