File:Figure-2.jpg
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Profile view of a typical specimen-electron interaction volume. Note that secondary electrons (SE) originate much shallower in the sample than backscattered electrons (BSE) and therefore provide more surface-driven and less composition-influenced information. From AAPG Memoir 102, Chapter 1, Huang et al., 2013, DOI: 10.1306/13391699M1023580.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 17:30, 15 August 2014 | | 960 × 722 (33 KB) | Molyneux (talk | contribs) | Profile view of a typical specimen-electron interaction volume. Note that secondary electrons (SE) originate much shallower in the sample than backscattered electrons (BSE) and therefore provide more surface-driven and less composition-influenced infor... |
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