File:Figure-9.jpg
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At left, a schematic diagram of operation of an FIB-SEM system. The FIB sputters away a thin layer of the sample at a time, while the electron beam/detector system captures an image of each newly exposed surface. At right, a picture of a commercial FIB-SEM CrossBeam™ system, Auriga. From AAPG Memoir 102, Chapter 1, Huang et al., 2013, DOI: 10.1306/13391699M1023580.
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 17:35, 15 August 2014 | | 982 × 410 (22 KB) | Molyneux (talk | contribs) | At left, a schematic diagram of operation of an FIB-SEM system. The FIB sputters away a thin layer of the sample at a time, while the electron beam/detector system captures an image of each newly exposed surface. At right, a picture of a commercial FIB... |
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