File:Sem-xrd-cl-and-xf-methods fig2.png

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X-ray diffraction configuration. Knowledge of the wavelength (X) and angle of incidence allows the d spacing to be calculated.

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current22:29, 14 January 2014Thumbnail for version as of 22:29, 14 January 2014933 × 1,051 (19 KB)Importer (talk | contribs)X-ray diffraction configuration. Knowledge of the wavelength (X) and angle of incidence allows the ''d'' spacing to be calculated. Category:Laboratory methods

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