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→Scanning electron microscopy (SEM)
==Scanning electron microscopy (SEM)==
==Scanning electron microscopy (SEM)==
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<gallery>
file:sem-xrd-cl-and-xf-methods_fig1.png|{{figure number|1}}Schematic drawing of a common scanning electron microscope showing how the sample is “iluminated” by an electron beam and amplified for viewing by the operator.
file:sem-xrd-cl-and-xf-methods_fig1.png|{{figure number|1}}Schematic drawing of a common scanning electron microscope showing how the sample is “iluminated” by an electron beam and amplified for viewing by the operator.
file:sem-xrd-cl-and-xf-methods_fig2.png|{{figure number|2}}X-ray diffraction configuration. Knowledge of the wavelength (X) and angle of incidence allows the ''d'' spacing to be calculated.
file:sem-xrd-cl-and-xf-methods_fig2.png|{{figure number|2}}X-ray diffraction configuration. Knowledge of the wavelength (X) and angle of incidence allows the ''d'' spacing to be calculated.